logo English | 中文 
Home About Us Product & Services Our Technology Contact Us
Main Pic The Spirit and Power to Transform Wisdom into Business

 

Our Technology

R&D Center

Our Innovations


News
Read more about
Nagase in the News


Take me there fast

 

Scanning Electron Microscope

Specification
Function surface form interpretation, quantitative or qualitative analysis and mapping of element
Ability secondary, reflective electron detector energy dipersive X-ray spectroscope
resolution ; 3.5nm

Back to Evaluation Test Instruments

 

Other Related Info
Investor's Info
Business Ventures
Keyword Search