logo English | 中文 
Home About Us Product & Services Our Technology Contact Us
Main Pic The Spirit and Power to Transform Wisdom into Business

 

Our Technology

R&D Center

Our Innovations


News
Read more about
Nagase in the News


Take me there fast

 

Ellipsometer

Specification
Function measurement of coating thickness, refractive index and component ratio of multilayer film

Back to Evaluation Test Instruments

 

Other Related Info
Investor's Info
Business Ventures
Keyword Search